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Computer Summaries
Semiconductor Test

Hollywood All-Jumps
AC Tester

Engineering Functional and AC Tester
(This page is not intended
for small screens.)

by Vaughn Aubuchon

HERE I present a summary of the Hollywood All-Jumps tester, which I designed and built at Monolithic Memories in Sunnyvale, California. The tester was used to evaluate and characterize bipolar semiconductor ROMs, PROMS, PALs and PLAs. A total of 4 units were built.
.

100

140

Table of Contents

1. Drawing of Tester

2.
Block Diagram

3.
Features

4.
Specifications

5.
Test Time Chart

6.
Desc. of Operation

7. Instructions for Use

8.
Special Operations

9.
Adapter Selection

10.
PC Board

11.
Parts List

12.
Some Perspective



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1. Front Panel Drawing -
Hollywood All-Jumps Tester

Hollywood All-Jumps A.C. Tester

Drawing of the Hollywood All-Jumps A.C. Tester
3-position switches are shown with black bat-handles.




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2. Block Diagram -
Hollywood All-Jumps Tester

Hollywood All-Jumps Block Diagram
Above is a block diagram for the Hollywood All-Jumps IC Tester.




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3. Features -
Hollywood All-Jumps Tester

Parameter Measured
Measures Functionality vs. Vcc vs. Output vs. Address
Measures Address Access Time
Measures Enable and Disable Time
Measures Address Set-up Time
Measures Clock-to-Output Delay Time

Selective Parameter Measurement
Selective Output Measurement
Selective Address Measurement

Conditions
100% of all transitions possible
100% of all transitions possible
100% of all transitions possible
100% of all transitions possible
100% of all transitions possible

tPD0, tPD1 or both simultaneously
One, any or all outputs simultaneously
High, low or pulse - any or all inputs

400 - 680

280




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4. Specifications -
Hollywood All-Jumps Tester

Range

0 - 999 ns

-

Accuracy

± 1 ns
± 4 ns

from 0 - 100 ns
from 101 - 999 ns

Repeatability

± 1 ns
± 4 ns

from 0 - 100 ns
from 101 - 999 ns

Internal Vcc

4.50, 4.75.
5.00, 5.25, 5.50 VDC

Tolerance is ± 0.5% (± 0.02 V)

200

180

300 - 680




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5. Test Time Chart -
Hollywood All-Jumps Tester

# of
Lines
Tested

# of Tests Performed
Delay Limit (DUT Speed)
Binary
Decimal
50 ns
100 ns
500 ns
999 ns
9
A82 - A8
261,888
0.14 sec.
0.15 sec.
0.28 sec.
0.4 sec.
10
A92- A9
1,048,064
0.56 sec.
0.62 sec.
1.1 sec.
1.6 sec.
11
A102- A10
4,193,280
2.3 sec.
2.5 sec.
4.2 sec.
6.5 sec.
12
A112- A11
16,775,168
9.0 sec.
10 sec.
17.4 sec.
26 sec.

There are 2 primary factors which determine the length of a complete A.C. test.
One is the number of address inputs required, and the other is the physical switching time of the device being tested. The machine must wait for the test device to respond, over and over again. The effect of this can be seen in the above chart. When the device requires nearly a full microsecond to switch, a complete test requires a full 26 seconds.

-

50

100

120

100

100

100

100 - 680




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6. Description of Operation -
Hollywood All-Jumps Tester

Introduction
The "Hollywood All-Jumps" was originally designed as an engineering tool to evaluate the A.C. characteristics of bipolar ROMs and PROMs. The original concept was to create a low-cost bench-top tester capable of providing the most complete and accurate A.C. characterization data possible on the devices tested.

However, the machine has also evolved into the fastest and most accurate all-jumps tester available, while maintaining all engineering functions. In addition, use of the tester has been extended to character generators, registered PROMs and ROMs, latches, registers, PALs, PLAs, and microprocessors - virtually any single clock (or no clock) bipolar device.

Circuit Description
The basic accuracy of the tester is established by precision programming a precision one-shot. The outputs of this one-shot are used to a) latch the inputs of the Device Under Test, b) wait an exact number of nanoseconds, and then c) latch the outputs. If the latched data is correct, the device passes. If not, the device did not switch fast enough and therefore fails.

Another important factor which establishes the accuracy of the tester is the selection of the input and output latches to the DUT. The absolute parameters of these latches is not important, but the skew is. The input latches must have equal clock-to-output delays(tPD0 and tPD1), and the output latches must have equal setup times for a 0 and a 1, with respect to the clock.

Logic control is implemented by a chain of high speed one-shots connected in a circle. This circle is interrupted at appropriate points to stop-on-fail, start, etc.

Address generation was done with National Semiconductor DM8556 counters, which are uniquely suited to this application. Alternately tri-stating the bussed outputs provides a simple yet effective configuration, allowing "back and forth" switching and self-loading to eliminate redundancy.

Engineering Evaluation Operation
The Hollywood All-Jumps is essentially a "Go - No go" tester which always seeks the worst case, unless programmed differently. The machine can be front-panel programmed to Stop-on-first-fail, sequence through all failures, or ignore all failures. When the tester stops on a failure, the address "switched to" is displayed by the address LEDs. To determine the address "switched from", simply switch the front panel toggle switch to "Old Address". This will indicate which addresses are being switched and in which direction, as well as which address lines are held low and held high.

When the device fails, the slowest transition can be saved and repeated continuously by the flip of a switch. In this mode, a high-speed dual-trace oscilloscope can be used to directly observe the accuracy of the machine, thus squelching any "Doubting Thomas", a most useful feature I have found. This mode also allows the user to vary Vcc and/ or temperature, and observe the effect on the worst case transitions.


Small Production Operation
To set up the tester for use, simply install the appropriate adapters for the devices to be tested, dial in the delay limit, select the desired Vcc, and program the test desired on the front panel switches.

To simplify operation, the production test person need only be told "All switched up", for normal production operation. Deviations from the standard test are explained in the operator's manual. When the device passes, the test result light turns green and a speaker emits a "beep" - when the device failsw, the result light turnns redand the speaker emits a "buzz".

340

340 - 680




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7. Instructions for Use -
Hollywood All-Jumps Tester

Instructions for "Normal" Mode (tAA, tEA and tER simultaneously)
1. Turn on the power switch on right side of the box.

2. Select and install the appropriate adapter for the device to be tested.
Refer to "test Guide" to find proper adapter. (no adapter is required for the 5240, 5275, 5280, 5335, and 5340).

3. Set the "# of tests" switch to correspond with the number of inputs to be tested (A8, A9, A10 or A11). See the Test Guide for the specific product.

4. For normal operation, all other switches are placed in the "toggle-handle-up" position.
If desired, these switches may be used to alter the standard in order to provide
additional information on the device (characterization).

5. Install 2 devices which are functionally identical. If they are not functionally identical,
the tester will never pass (except with the "stop-on-fail" switch in the "Don't" position.

6. Set the Digiswitch delay to the value specified in the test specification.

7. Push the "Start" button.

Instructions for tAA Only Mode
(same as Normal, except) -

3. Same as Normal Mode, plus -
Look in the Test Guide column marked "enable lines". Switch these toggle switches all the way down.

Instructions for tEA and tER Only Mode
(same as Normal, except) -

3. Same as Normal Mode, plus -
In order to test tEA and tER, it is necessary to enable and disable a device at an address which has programmed bits.
A thorough check of the device includes checking every output.
To do this, select an address which has all outputs low.
To do this -
     A. Install only ONE device in the tester (in either socket, it doesn't matter).
     B. Place all 12 address switches down.
     C. Look in the test guide column marked "enable lines".
          Switch all these toggle switches all the way up.
          All the switches to the right of these become the address lines.
     D. Push the Start button and observe which output fail lights are on. Begin changing the address
          lines between the center switch position (marked "High") and the bottom switch position
          (marked low) while pushing the Start button until all output lights are on (or as many as possible).
     E. Install the other device and begin testing.




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8. Special Operations -
Hollywood All-Jumps Tester

Operation - "Sequential Fail"
Purpose - To determine every address transition that an output(s) fails at a given delay time.

Instructions -
     1. Place all switches in the normal "toggle-handle-up" position.
     2. While holding the start button down, switch from "first-fail" to "sequential".
          Release the start button.
The tester will now operate normally, except -
When the device fails and the start button is depressed, the failure will be cleared,
but NOT the address counters.
This allows the test to be resumed at the point where it was stopped.

Operation - "Save Addresses"
Purpose - To stop the address counters from incrementing after
                 they have stopped on the failed parameter.
     This allows the tester to cycle back and forth between the 2 addresses which produce
     the worst case access time. This is very useful for 2 reasons -
     1. To observe the effects on worst case device speed by varying Vcc or temperature
     2. To observe the actual worst case switching time on an oscilloscope.

Instructions -
     1. Place all switches in the normal "toggle-handle-up" position.
     2. While holding the Start button down, switch from "First Fail" to "Sequential".
          Release the Start button.
     3. When the device fails, switch from "Run" to "Save Addresses".
     4. The next time the Start button is pressed, the tester will continuously switch back and forth
          between the two addresses which will produce the worst case access time.
     5. Vcc, temperature and delay time may now be varied to obtain data
          on the worst case address transition.




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9. Adapter Selection -
Hollywood All-Jumps Tester

Switch Position
Notes
Device
#
Device
Type
Normal
Test
tAA
Only
tEA
t
ER
Only
Enable
Lines
Out-
puts
Adapter
Number

Note

1

5200-01
A9
A8
A9
A8 - A9
4
5200

-

2

5300-01
A9
A8
A9
A8 - A9
4
5200

-

-

3

5205-06
A9
A8
A9
A9
4
5200

-

4

5305-06
A9
A8
A9
A9
4
5200

-

-

5

5308-09
A9
A8
A9
A8 - A9
8
5348

20 pins (scrambled)

-

6

5230-31
A8
A8
A8
A5
8
5230

-

7

5330-31
A8
A8
A8
A5
8
5230

-

-

8

5335-36
A11
A7
A11
A10 - A11
8
STAN

A8, A9 = N.C.

-

9

5240-41
A11
A8
A11
A10 - A11
8
STAN

A9 = N.C.

10

5340-41
A11
A8
A11
A10 - A11
8
STAN

A9 = N.C.

-

11

5348-49
A9
A8
A9
A9
8
5348

20 pins (scrambled)

-

12

5250-51
A11
A9
A11
A11
4
5350

18 pins (scrambled)

13

5350-51
A11
A9
A11
A11
4
5350

18 pins (scrambled)

Device
Type
Normal
Test
tAA
Only
tEA
t
ER
Only
Enable
Lines
Out-
puts
Adapter
Number

Note

14

5252-53
A11
A9
A11
A10 - A11
4
5252

18 pins

15

5352-53
A11
A9
A11
A10 - A11
4
5252

18 pins

-

16

5255-56
A11
A9
A11
A10 - A11
10
5255

-

17

6260-61
A11
A9
A11
A10,11,12
9
5255

-

-

18

6275-76
A11
A10
A11
A11,12,13
8
STAN

-

-

19

5280-81
A11
A9
A11
A10, A11
A12, A13
8
STAN

-

20

5380-81
A11
A9
A11
8
STAN

-

-

21

5282-83
A11
A9
A11
A10, A11
A12, A13
8
STAN

-

-

22

5284-85
A11
A9
A11
A11
8
STAN

A10 = N.C.

23

5384-85
A11
A9
A11
A11
8
STAN

A10 = N.C.

-

24

5286-87
A11
A9
A11
A10 - A11
8
5286

22 pin (scrambled)

25

5386-87
A11
A9
A11
A10 - A11
8
5286

22 pin (scrambled)

-

26

5288-89
A9
A9
none
none
8
5348

20 pin (scrambled)

-

27

6061

A11
A9
A11

A10, A11,
A12, A13

5
STAN

-

28

63135

A9
A7
A9
A8 - A9
8
63135

-

29

63137

A9
A8
A9
A9
8
63137

-

30

63139

A11
A11
A11
A11
8
STAN

A9, A10 = N.C.

31

63141

A9
A9
A9
A9
8
53141

-

-

NOTES -

40

90 - 650

60

60

60

70

50

90

130




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10. PC Board -
Hollywood All-Jumps Tester

PC board for Hollywood All-Jumps Tester - rightPC board for Hollywood All-Jumps Tester - leftThe 2 photos above depict the bottom of the PC board
for the Hollywood All-Jumps IC tester.
The scans have been magnified 1.6X actual size, for clarity.




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11. IC Parts List -
Hollywood All-Jumps Tester

Part
Number

Description

Quant.
Req.
Logic
IC
Number
.
AC
IC
Number

5493

4-Bit Binary Counters

2

29 - 30

6301-1

256 x 4 TTL PROM Memory

1
3

7200

4-Bit Comparator

2

21 - 23

7400

Quad NAND Gate

3
7 - 12 - 22

7404

Hex Inverter

1
6

7408

Quad 2-Input AND Gates

1

20

7413

Dual 4-Input Positive-NAND Schmitt Inp.

1
1

7430

8-Input Positive NAND Gate

2
5
28

7474

Dual D-Type Flip-Flops

3

4 - 8 --38

7486

Quad 2-Input Exclusive-OR Gate

2

24 - 26

74121

Precision One-Shot

1 - -3

34 - 35

18 - 19

74123

Dual Retriggerable Monostable Multivibrators

3

2 - 3 --31

74132

Quad 2-Input NAND Gates w/ Schmitt In.

1

33

74S174

Hex D-type Flip-Flop - Schottky

2

16 - 17

74S175

Quad D-type Flip-Flop - Schottky

2

25 - 27

74253

8-Input Multiplexer w/ Tri-State Outputs

2

36 - 37

DM8556

4-Bit Binary Counter w/ Tri-state Outputs

6
9 - 10 - 11
13 - 14 - 15

Socket for resistors/ caps.

-

32

Total ICs =

38

TTL, S Schottky Bipolar, L Low Power, LS Low Power Schottky

60

320 - 600

50

90

80


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12. Some Perspective

A nanosecond is one one-billionth of a second.
The lay person might appreciate a comparison of
what measuring nanoseconds is all about.
Frankly, without the invention of the Tektronix Sampling System,
we would all still be in the dark.
Thank G0D for Oregon!

Light travels about 0.98 feet in one nanosecond.

If the distance from here to the moon of 248,000 miles = a second,
(actually 186,000 MPS is the true figure)
then a nanosecond would be equal to 0.000248 mile,
or about 1.3 feet.

This perspective is meant to imply that it is exceedingly difficult to measure this stuff.
Especially, considering voltage variations, IC part variations, rise-and-fall time variations, temperature variations, shifting threshold variations, flawed assumption variations, empirical observation variations, etc.



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Vaughn's Other
Semiconductor Related Pages

* ASIC vs. FPGA

*
CPU Evolution

*
Electronics Distributors

*
Hollywood All-Jumps

*
Semiconductor Manufacturers

*
Timing Diagram




Disclaimer -
None of this would have been possible without Bill Moss,
an extraordinary manager with great understanding.

The Hollywood All-Jumps A.C. Tester Model #1000101 described on this page is now 35 years old (2012-1977).

Why did I create this page? Bored senseless. Plus,
I always regretted not having done a decent job of documentation 35 years ago. Loose ends piff me off.

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This Vaughns Hollywood All-Jumps Tester
Summary was last updated on 2015-03-04.